test_and_change_bit
#define test_and_change_bit(nr,p) ATOMIC_BITOP(test_and_change_bit,nr,p)
#define sync_test_and_change_bit(nr, p) test_and_change_bit(nr, p)
test_and_change_bit(nr, addr);
test_and_change_bit(nr, addr);
return test_and_change_bit(nr, addr);
return test_and_change_bit(nr, addr);
int test_and_change_bit(unsigned long nr, volatile unsigned long *addr);
return test_and_change_bit(READ_BALANCE_RR, &device->flags);
toggle_bit = !test_and_change_bit(bmap_id,
#define hci_dev_test_and_change_flag(hdev, nr) test_and_change_bit((nr), (hdev)->dev_flags)
KCSAN_EXPECT_READ_BARRIER(test_and_change_bit(0, &test_var), true);
KCSAN_EXPECT_WRITE_BARRIER(test_and_change_bit(0, &test_var), true);
KCSAN_EXPECT_RW_BARRIER(test_and_change_bit(0, &test_var), true);
KCSAN_CHECK_READ_BARRIER(test_and_change_bit(0, &test_var));
KCSAN_CHECK_WRITE_BARRIER(test_and_change_bit(0, &test_var));
KCSAN_CHECK_RW_BARRIER(test_and_change_bit(0, &test_var));
KUNIT_EXPECT_FALSE(test, test_and_change_bit(params->nr, bitmap));
KUNIT_EXPECT_TRUE(test, test_and_change_bit(params->nr, bitmap));
KUNIT_EXPECT_KASAN_FAIL(test, test_and_change_bit(nr, addr));