dt_probe_t
dt_probe_t *prp;
dt_probe_t *prp = yypcb->pcb_probe;
dt_probe_t *prp = idp->di_data;
dt_probe_t *prp = yypcb->pcb_probe;
dt_probe_t *prp;
dt_probe_t *prp = pnp->dn_ident->di_data;
dt_probe_t *old, dt_probe_t *new)
dt_probe_t *prp = dnp->dn_ident->di_data;
dt_probe_t *prp = dt_probe_lookup(pvp, probename);
dt_probe_t *prp = idp->di_data;
dt_probe_t *prp = idp->di_data;
static dt_probe_t *
dt_probe_t *prp;
dt_probe_t *
dt_probe_t *
dt_probe_t *prp;
if ((prp = dt_alloc(dtp, sizeof (dt_probe_t))) == NULL)
dt_probe_declare(dt_provider_t *pvp, dt_probe_t *prp)
dt_probe_destroy(dt_probe_t *prp)
dt_probe_define(dt_provider_t *pvp, dt_probe_t *prp,
dt_probe_tag(dt_probe_t *prp, uint_t argn, dt_node_t *dnp)
dt_probe_t *
dt_probe_t *prp = NULL;
const dt_probe_t *prp = idp->di_data;
extern dt_probe_t *dt_probe_info(dtrace_hdl_t *,
extern dt_probe_t *dt_probe_lookup(dt_provider_t *, const char *);
extern void dt_probe_declare(dt_provider_t *, dt_probe_t *);
extern void dt_probe_destroy(dt_probe_t *);
extern int dt_probe_define(dt_provider_t *, dt_probe_t *,
extern dt_node_t *dt_probe_tag(dt_probe_t *, uint_t, dt_node_t *);
extern dt_probe_t *dt_probe_create(dtrace_hdl_t *, dt_ident_t *, int,